Record link: 
http://hdl.handle.net/20.500.12708/195709
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Title: 
A pCN-MCMC Method for a Bayesian Inverse Problem in Nanoscale Devices
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Citation: 
Taghizadeh, L. (2024). A pCN-MCMC Method for a Bayesian Inverse Problem in Nanoscale Devices. In SIAM 2024 Searchable Abstracts Document: SIAM Conference on Uncertainty Quantification (UQ24) (pp. 124–124). SIAM.
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Publication Type: 
Inproceedings - Abstract Book Contribution
en
Language: 
English
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Authors: 
Taghizadeh, Leila 
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Organisational Unit: 
E101-03-2 - Forschungsgruppe Unsicherheitsquantifizierung 
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Published in: 
SIAM 2024 Searchable Abstracts Document: SIAM Conference on Uncertainty Quantification (UQ24) 
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Date (published): 
21-Feb-2024
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Event name: 
SIAM Conference on Uncertainty Quantification (UQ24) 
en
Event date: 
27-Feb-2024 - 1-Mar-2024
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Event place: 
Trieste, Italy
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Number of Pages: 
1
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Publisher: 
SIAM
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Keywords: 
Uncertainty Quantification; Bayesian Inverse Problems; Semiconductor Devices
en
Project title: 
Rechnerische Unsicherheitsquantifizierung in Nanotechnologie: V 1000-N (FWF - Österr. Wissenschaftsfonds) 
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Research Areas: 
Mathematical and Algorithmic Foundations: 100%
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Science Branch: 
1010 - Mathematik: 100%
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Appears in Collections:
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