Institut für Mikroelektronik

Organization Name (de) Name der Organisation (de)
E360 - Institut für Mikroelektronik
 
Code Kennzahl
E360
 
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Institute
Parent OrgUnit Übergeordnete Organisation
 
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Results 21-40 of 2854 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
21Jorstad, Nils Petter ; Hadamek, Tomas ; Bendra, Mario ; Ender, Johannes ; Pruckner, Bernhard ; Goes, Wolfgang ; Sverdlov, Viktor Numerical Simulations of Spintronic Magnetoresistive MemoriesInproceedings Konferenzbeitrag26-Oct-2023
22Sverdlov, Viktor ; Selberherr, Siegfried Charge and Spin Transport in Semiconductor DevicesInproceedings Konferenzbeitrag 24-Oct-2023
23Sverdlov, Viktor ; Bendra, Mario ; Pruckner, Bernhard ; Jorstad, Nils Petter ; Hadamek, Tomas ; Ender, Johannes ; Lacerda de Orio, Roberto ; Gös, Wolfgang Spin and Charge Transport in Ultra-Scaled MRAM CellsInproceedings Konferenzbeitrag Oct-2023
24Bendra-2023-Solid-State Electronics-vor.pdf.jpgBendra, Mario ; Fiorentini, Simone ; Selberherr, Siegfried ; Gös, Wolfgang ; Sverdlov, Viktor A multi-level cell for ultra-scaled STT-MRAM realized by back-hoppingArticle Artikel Oct-2023
25Gull-2023-Solid-State Electronics-vor.pdf.jpgGull, Josef ; Kosina, Hans Monte Carlo study of electron–electron scattering effects in FET channelsArticle Artikel Oct-2023
26Souza Berti Rodrigues-2023-Journal of Computational Electronics-vor.pdf.jpgSouza Berti Rodrigues, Francio ; Aguinsky, Luiz Felipe ; Lenz, Christoph ; Hössinger, Andreas ; Weinbub, Josef 3D modeling of feature-scale fluorocarbon plasma etching in silicaArticle Artikel Oct-2023
27Reiter, Tobias ; Filipovic, Lado Fast 3D Flux Calculation using Monte Carlo Ray Tracing on GPUsInproceedings Konferenzbeitrag 20-Sep-2023
28Achleitner, Franz ; Arnold, Anton ; Carlen, Eric ; Jüngel, Ansgar ; Mehrmann, Volker The Hypocoercivity Index for the short time behavior of linear time-invariant ODE systemsPresentation Vortrag18-Sep-2023
29Shobeyrian, F. ; Shojaei, F. ; Soleimani, M. ; Pourfath, M. Two-dimensional Cr₂X₂Y₆ (X = Si, Ge; Y = S, Se, Te) family with potential application in photocatalysisArticle Artikel 1-Sep-2023
30Aguinsky, Luiz Felipe ; Toifl, Alexander ; Souza Berti Rodrigues, Francio ; Hössinger, Andreas ; Weinbub, Josef A Modern Formulation of Knudsen Diffusion with Applications to NanofabricationInproceedings Konferenzbeitrag 1-Sep-2023
31Jorstad, Nils Petter ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor Spin Drift-Diffusion Boundary Conditions for FEM Modeling of Multilayer SOT DevicesInproceedings KonferenzbeitragSep-2023
32Sverdlov, Viktor ; Jorstad, Nils Petter ; Bendra, Mario ; Hadamek, Tomas ; Goes, Wolfgang Modeling Emerging Spintronic Devices and Spintronic THz EmittersInproceedings Konferenzbeitrag Sep-2023
33Sverdlov, Viktor ; Bendra, Mario ; Pruckner, Bernhard ; Fiorentini, Simone ; Goes, Wolfgang ; Selberherr, Siegfried Comprehensive Modeling of Advanced Composite Magnetoresistive DevicesInproceedings Konferenzbeitrag Sep-2023
34Bendra, Mario ; Lacerda de Orio, Roberto ; Goes, Wolfgang ; Sverdlov, Viktor ; Selberherr, Siegfried Modeling of Ultra-Scaled Magnetoresistive Random Access MemoryInproceedings Konferenzbeitrag Sep-2023
35Tselios, Konstantinos ; Knobloch, Theresia ; Waldhör, Dominic ; Stampfer, Bernhard ; Ioannidis , Eleftherios ; Enichlmair , Hubert ; Minixhofer , Rainer ; Grasser, Tibor ; Waltl, Michael Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂ TransistorsArticle Artikel Sep-2023
36Mounir, Ahmed ; Iniguez, Benjamin ; Lime, Francois ; Kloes, Alexander ; Knobloch, Theresia ; Grasser, Tibor Compact I-V Model for back-gated and double-gated TMD FETsArticle Artikel Sep-2023
37Ceric, Hajdin ; Lacerda de Orio, Roberto ; Selberherr, Siegfried Statistical Study of Electromigration in Gold InterconnectsArticle Artikel Aug-2023
38Wilhelmer-2023-Nanomaterials-vor.pdf.jpgWilhelmer, Christoph ; Waldhör, Dominic ; Cvitkovich, Lukas ; Milardovich, Diego ; Waltl, Michael ; Grasser, Tibor Over- and Undercoordinated Atoms as a Source of Electron and Hole Traps in Amorphous Silicon Nitride (a-Si3N4)Article Artikel Aug-2023
39Hadamek-2023-Micromachines-vor.pdf.jpgHadamek, Tomas ; Jorstad, Nils Petter ; Lacerda de Orio, Roberto ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor A Comprehensive Study of Temperature and Its Effects in SOT-MRAM DevicesArticle Artikel Aug-2023
40Ravichandran, Harikrishnan ; Knobloch, Theresia ; Pannone, Andrew ; Karl, Alexander ; Stampfer, Bernhard ; Waldhör, Dominic ; Zheng, Yikai ; Sakib, Najam ; Karim Sadaf, Muhatsim ; Pendurthi, Rahul ; Torsi, Riccardo ; Robinson, Joshua A. ; Grasser, Tibor ; Das, Saptarshi Observation of Rich Defect Dynamics in Monolayer MoS₂Article Artikel 25-Jul-2023