Institut für Mikroelektronik

Organization Name (de) Name der Organisation (de)
E360 - Institut für Mikroelektronik
 
Code Kennzahl
E360
 
Type of Organization Organisationstyp
Institute
Parent OrgUnit Übergeordnete Organisation
 
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PreviewAuthor(s)TitleTypeIssue Date
1Tselios Konstantinos - 2024 - Statistical Analysis of Reliability and...pdf.jpgTselios, Konstantinos Statistical analysis of reliability and variability effects in CMOS technologies based on single-defect spectroscopyThesis Hochschulschrift 2024
2Stampfer Paul - 2024 - Advanced Electrial Characterization of Defects in Silicon...pdf.jpgStampfer, Paul Advanced Electrial Characterization of Defects in Silicon PhotodiodesThesis Hochschulschrift 2024
3Fiorentini Simone - 2023 - Computation of torques in magnetic tunnel junctions.pdf.jpgFiorentini, Simone Computation of torques in magnetic tunnel junctionsThesis Hochschulschrift 2023
4Gollner Laura - 2023 - Development and application of an ensemble Monte Carlo...pdf.jpgGollner, Laura Development and application of an ensemble Monte Carlo frameworkThesis Hochschulschrift 2023
5Bobinac Josip - 2023 - Process simulation and model development in ViennaPS.pdf.jpgBobinac, Josip Process simulation and model development in ViennaPSThesis Hochschulschrift 2023
6Adel Alexander - 2023 - Dynamic particle data structures for Wigner Monte Carlo...pdf.jpgAdel, Alexander Dynamic particle data structures for Wigner Monte Carlo simulationsThesis Hochschulschrift 2023
7Skenderaj Elio - 2023 - Automated FEM model generation for the simulation of...pdf.jpgSkënderaj, Elio Automated FEM model generation for the simulation of microheatersThesis Hochschulschrift 2023
8Lenz Christoph - 2023 - Hierarchical Grid Algorithms for Topography Simulation.pdf.jpgLenz, Christoph Hierarchical grid algorithms for topography simulationThesis Hochschulschrift 2023
9Balla Cedrik - 2023 - Tetrahedral Mesh Cleaving of Level Set Surfaces.pdf.jpgBalla, Cedrik Tetrahedral mesh cleaving of level set surfacesThesis Hochschulschrift 2023
10Benzer Anna - 2023 - Density Functional Theory DFT Investigation of Novel...pdf.jpgBenzer, Anna Density functional theory (DFT) investigation of novel materials for application in sensingThesis Hochschulschrift 2023
11Stürmer, Peter Design of AMR sensors for 3D magnet motion trackingThesis Hochschulschrift2022
12Quell Michael - 2022 - Parallel velocity extension and load-balanced...pdf.jpgQuell, Michael Parallel velocity extension and load-balanced Re-distancing on hierarchical grids for high performance process TCADThesis Hochschulschrift 2022
13Knobloch Theresia - 2022 - On the electrical stability of 2D material-based...pdf.jpgKnobloch, Theresia On the electrical stability of 2D material-based field-effect transistorsThesis Hochschulschrift 2022
14Klemenschits Xaver - 2022 - Emulation and simulation of microelectronic...pdf.jpgKlemenschits, Xaver Emulation and simulation of microelectronic fabrication processesThesis Hochschulschrift 2022
15Gull Josef - 2022 - Implementation of a two-particle Monte Carlo method for the...pdf.jpgGull, Josef Implementation of a two-particle Monte Carlo method for the treatment of electron-electron-scattering in semiconductorsThesis Hochschulschrift 2022
16Aguinsky Luiz Felipe - 2022 - Phenomenological modeling of reactive...pdf.jpgAguinsky, Luiz Felipe Phenomenological modeling of reactive single-particle transport in semiconductor processingThesis Hochschulschrift 2022
17Schleich Christian - 2022 - Modeling of defect related reliability phenomena in...pdf.jpgSchleich, Christian Modeling of defect related reliability phenomena in SiC power-MOSFETsThesis Hochschulschrift 2022
18Michl Jakob Daniel - 2022 - Charge trapping and variability in CMOS technologies...pdf.jpgMichl, Jakob Daniel Charge trapping and variability in CMOS technologies at cryogenic temperaturesThesis Hochschulschrift 2022
19Berens Judith Veronika - 2021 - Carrier mobility and reliability of 4H-SiC...pdf.jpgBerens, Judith Veronika Carrier mobility and reliability of 4H-SiC trench MOSFETsThesis Hochschulschrift 2021
20Ruch Bernhard - 2021 - Hot-carrier degradation in planar and trench Si-MOSFETs.pdf.jpgRuch, Bernhard Hot-carrier degradation in planar and trench Si-MOSFETsThesis Hochschulschrift 2021