Various electronic components are used in the semiconductor industry. Even the slightest contamination could affect and modify the functionality of these components. Therefore these are protected from environmental influences by housing with different materials, such as Mold-Compound. However is also possible that these used materials contain some contaminations or become unstable in presence of external influences. Ion-diffusion and probably accumulation of ions at component interfaces may generate problems. In this thesis, environmental influences were simulated in the laboratory scale to verify the mobilization of trace elements. Various extraction experiments were realized to research the leaching behavior of the polymer composite material. The analysis of the sample extracts was performed by inductively coupled plasma mass spectroscopy (ICP-MS). Due to the usage of internal standards any fluctuations during measurements could be corrected and adjusted properly. The results of this thesis demonstrate that extraction of certain elements from the Mold-Compound is possible. In addition there are huge discrepancies caused by the selected parameters. Temperature has the widest influence on the leaching process, in addition the pH-range and the leaching durations have a wide influence on the mass of analytes released during the extraction, as well. For the elements aluminum and magnesium, several g/g could be mobilized, whereby only a few ng/g could be extracted for the elements copper, sodium, zinc, barium and bismuth. These results were verified by laser ablation - ICP-MS (LA-ICP-MS). Thus it was possible to confirm the presence of certain elements in the polymer composite material and generate depth profiles from extracted samples. Furthermore possible influences on extractions of the sample surface were analyzed by scanning electron microscopy.