Titelaufnahme

Titel
Readout software for the Belle II silicon vertex detector and beam test data analysis / von Hao Yin
VerfasserYin, Hao
Begutachter / BegutachterinSchwanda, Christoph ; Bergauer, Thomas
ErschienenWien, 2015
Umfangii, 62 Seiten : Illustrationen, Diagramme
HochschulschriftTechnische Universität Wien, Diplomarbeit, 2015
Anmerkung
Zusammenfassung in deutscher Sprache
Titelübersetzung des Autors: Auslese-Software für den Belle II-Siliziumvertex-Detektor und Auswertung von Testbeam-Daten
SpracheEnglisch
DokumenttypDiplomarbeit
Schlagwörter (DE)Teilchenphysik / Siliziumvertex-Detektor / Auslesesystem
Schlagwörter (EN)Particle physics / Silicon vertex detector / readout system
URNurn:nbn:at:at-ubtuw:1-78878 Persistent Identifier (URN)
Zugriffsbeschränkung
 Das Werk ist frei verfügbar
Dateien
Readout software for the Belle II silicon vertex detector and beam test data analysis [9.52 mb]
Links
Nachweis
Klassifikation
Zusammenfassung (Englisch)

The Belle experiment located at Tsukuba (Japan) was designed to ingestive CP violations during quark mixing processes. After a decade of successful operation the Belle detector is going to be upgraded. The upgrade includes an increase of luminosity from 2.11×10^(34) to about 8×10^(35) cm^(-2)×s^(-1). In order to cope with a 40 t detector (VXD) has been redesigned. The inner part of the VXD consists of two layers of silicon pixel detectors (PXD). Together with the silicon vertex detector (SVD) comprising of four layers of double sided silicon strip detectors (DSSD), the new BELLE II VXD will be able to perform high precision vertex measurements. The most time consuming task of this work was to continue the development of the control software (TuxDAQ) and the design of an online data quality monitoring application (TuxOA) for the SVD system. Both applications has been successfully tested during a beam test at DESY, Germany. Parts of both software systems will be implemented into the future SVD slow control system. The DESY beam test was the first integration test of SVD and PXD subsystems. During the measurements, several noise problems occurred. The impact of the noisy data and the effects on the analysis are discussed in this work. During the beam test at DESY the data was taken from four rectangular DSSDs at several temperatures. The DSSDs are samples taken from the barrel part of each layer of the SVD. The results were evaluated with TuxOA