In this work, new methods to study the real space wave functions of electrons in a solid using transmission electron microscopy (TEM) and electron energy loss spectrometry (EELS) are presented. To this end, the theory of both elastic and inelastic electron scattering is treated in a density-matrix formalism. In the process, the central quantities of inelastic electron scattering - the mixed dynamic form factor (MDFF) and the double differential scattering cross section (DDSCS) - are introduced. In addition to the formal theory, several approximations and simplifications, as well as their respective validities, are discussed. Furthermore, a method for diagonalizing the mixed dynamic form factor is described, which allows calculating high resolution energy filtered TEM images with unprecedented accuracy. Subsequently, several applications of the aforementioned theory to real-world examples are presented. On the one hand, the example of Silicon serves to demonstrate how the radial wave functions in the bulk can be measured; the agreement with the theoretical predictions proves to be very good. On the other hand, the determination of the wave functions' azimuthal dependence is derived. It turns out that the symmetry of the system under investigation is crucial to the success of this endeavor. With the new techniques presented here, it will be possible to measure electronic properties with atomic resolution, which can be of great importance, particularly in material science.