Name Card

Full name Familienname, Vorname
Dubec, Viktor
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-20 of 21 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Haberfehlner, Georg ; Bychikhin, Sergey ; Dubec, Victor ; Heer, Michael ; Podgaynaya, A ; Pfost, M ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping systemPräsentation Presentation2009
2Pogany, Dionyz ; Bychikhin, Sergey ; Heer, Michael ; Mamanee, Wasinee ; Dubec, Victor ; Gornik, Erich ; Johnsson, David ; Domanski, Krzysztof ; Esmark, Kai ; Stadler, Wolfgang ; Gossner, Harald ; Stecher, Matthias Application of transient interferometric mapping (TIM) technique for analysis of ns time scale thermal and free carrier dynamics in ESD protection devicesPräsentation Presentation2009
3Mamanee, Wasinee ; Johnsson, David ; Rodin, Pavel ; Bychikhin, Sergey ; Dubec, Victor ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz Interaction of traveling current filaments and its relation to a nontrivial thermal breakdown scenario in avalanching bipolar transistorArtikel Article2009
4Bychikhin, Sergey ; Dubec, Victor ; Kuzmik, Jan ; Würfl, Joachim ; Kurpas, Paul ; Teyssier, Jean-Pierre ; Pogany, Dionyz Current Gain Collapse in HBTs Analysed by Transient Interferometric Mapping MethodKonferenzbeitrag Inproceedings2007
5Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Brodbeck, T ; Stadler, Wolfgang Backside Interferometric Methods for Localization of ESD-Induced Leakage Current and Metal ShortsArtikel Article2007
6Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Brodbeck, T ; Stadler, Wolfgang Backside Interferometric Methods for Localization of ESD-Induced Leakage Current and Metal ShortsPräsentation Presentation2007
7Heer, Michael ; Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Frank, M ; Konrad, A ; Schulz, J Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-upArtikel Article2006
8Heer, Michael ; Bychikhin, Sergey ; Dubec, Victor ; Pogany, Dionyz ; Gornik, Erich ; Zullino, L. ; Andreini, A. ; Meneghesso, Gaudenzio Analysis of triggering behavior of low voltage BCD single and multi-finger gc-NMOS ESD protection devicesKonferenzbeitrag Inproceedings2006
9Heer, Michael ; Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Frank, M ; Konrad, A ; Schulz, J Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-upPräsentation Presentation2006
10Kuzmik, Jan ; Bychikhin, Sergey ; Dubec, Victor ; Blaho, M. ; Marso, M ; Kordos, P ; Suski, T ; Bockowski, M ; Grzegory, I ; Pogany, Dionyz Characterization of III-Nitride Group Semiconductors and Devices Using Optical MethodsKonferenzbeitrag Inproceedings2005
11Heer, Michael ; Dubec, Victor ; Blaho, M. ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Stecher, Matthias ; Groos, Gerhard Automated setup for thermal imaging and electrical degradation study of power DMOS devicesArtikel Article2005
12Heer, Michael ; Dubec, Victor ; Blaho, M. ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Stecher, Matthias ; Groos, Gerhard Automated setup for thermal imaging and electrical degradation study of power DMOS devicesPräsentation Presentation2005
13Dubec Viktor - 2005 - Advanced optical interferometric methods for nanosecond...pdf.jpgDubec, Viktor Advanced optical interferometric methods for nanosecond mapping of semiconductor devices under high energy pulsesThesis Hochschulschrift 2005
14Denison, Marie ; Blaho, M. ; Rodin, Pavel ; Dubec, Victor ; Pogany, Dionyz ; Silber, D ; Gornik, Erich ; Stecher, Matthias Moving Current Filaments in Integrated DMOS Transistors Under Short-Duration Current StressArtikel Article2004
15Dubec, Victor ; Bychikhin, Sergey ; Blaho, M. ; Heer, Michael ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Jensen, Nils ; Stecher, Matthias ; Groos, Gerhard Multiple-time-instant 2D thermal mapping during a single ESD eventPräsentation Presentation2004
16Bychikhin, Sergey ; Dubec, Victor ; Pogany, Dionyz ; Gornik, Erich ; Graf, M. ; Dudek, V. ; Soppa, W. Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stressPräsentation Presentation2004
17Pogany, Dionyz ; Bychikhin, Sergey ; Kuzmik, Jan ; Dubec, Victor ; Jensen, Nils ; Denison, Marie ; Groos, Gerhard ; Stecher, Matthias ; Gornik, Erich Thermal Distribution During Destructive Pulses in ESD Protection Devices Using a Single-Shot Two-Dimensional Interferometric MethodArtikel Article2003
18Denison, Marie ; Blaho, M. ; Silber, D ; Joos, J ; Jensen, Nils ; Stecher, Matthias ; Dubec, Victor ; Pogany, Dionyz ; Gornik, Erich Hot spot dynamics in quasi vertical DMOS under ESD stressKonferenzbeitrag Inproceedings2003
19Dubec, Victor ; Bychikhin, Sergey ; Blaho, M. ; Pogany, Dionyz ; Gornik, Erich ; Willemen, Joost ; Qu, N ; Wilkening, W ; Zullino, L. ; Andreini, A. A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stressPräsentation Presentation2003
20Pogany, Dionyz ; Bychikhin, Sergey ; Dubec, Victor ; Blaho, M. ; Litzenberger, Martin ; Kuzmik, Jan ; Pflügl, Christian ; Strasser, Gottfried ; Gornik, Erich Transient interferometric mapping of temperature and free carriers in semiconductor devicesKonferenzbeitrag Inproceedings2003