Name Card

Full name Familienname, Vorname
Lindsey, Sloan
 
Main Affiliation Organisations­zuordnung
 

Own Publications Eigene Publikationen

Results 1-13 of 13 (Search time: 0.005 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Lindsey, Sloan J. ; Hobler, Gerhard ; Maciążek, Dawid ; Postawa, Zbigniew Simple model of surface roughness for binary collision sputtering simulationsArtikel Article 2017
2Lindsey, Sloan ; Hobler, Gerhard ; Maciazek, D ; Postawa, Z Simple model of surface roughness for binary collision sputtering simulationsPräsentation Presentation2016
3Lindsey Sloan Jobe - 2015 - Computer simulation of FIB sputtering.pdf.jpgLindsey, Sloan Jobe Computer simulation of FIB sputteringThesis Hochschulschrift 2015
4Lindsey, S. ; Waid, S. ; Hobler, G. ; Wanzenböck, H.D. ; Bertagnolli, E. Inverse modeling of FIB milling by dose profile optimizationArtikel Article 2014
5Wanzenböck, Heinz D. ; Waid, Simon ; Hobler, Gerhard ; Lindsey, Sloan 2.5D-Nanoimprint LithographyPräsentation Presentation2014
6Lindsey, Sloan ; Hobler, Gerhard Simulation of Glancing Angle Sputtering with a Density Gradient Model to Represent Surface RoughnessPräsentation Presentation2013
7Lindsey, S. ; Hobler, G. Sputtering of silicon at glancing incidenceArtikel Article2013
8Lindsey, Sloan ; Waid, Simon ; Hobler, Gerhard ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich Inverse Modeling of FIB Milling by Dose Profile OptimizationPräsentation Presentation2013
9Lindsey, Sloan ; Hobler, Gerhard ; Rue, C ; Maazouz, M Focused Ion Beam Simulation - Investigation of the Curtaining Effect in TEM Sample PreparationBericht Report2012
10Lindsey, Sloan ; Hobler, Gerhard The significance of redeposition and backscattering in nanostructure formation by focused ion beamsArtikel Article2012
11Lindsey, Sloan ; Hobler, Gerhard Sputtering of Silicon at Glancing IncidencePräsentation Presentation2012
12Waid, Simon ; Mika, Johann ; Lindsey, Sloan ; Wanzenböck, Heinz D. ; Hobler, Gerhard ; Bertagnolli, Emmerich Fabrication of 3D Axon Isolation Channels by Inverse Modelling Assisted Focused Ion Beam PatterningPräsentation Presentation2012
13Lindsey, Sloan ; Hobler, Gerhard The Role/Relevance/Significance/Implications of Redeposition and Backscattering in Focused Ion Beam Milling/Nanostructure Formation by Focused Ion BeamsPräsentation Presentation2011