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Full name Familienname, Vorname
Hehenberger, Philipp Paul
 
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Results 1-20 of 23 (Search time: 0.007 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Franco, J. ; Kaczer, Ben ; Toledano-Luque, M. ; Roussel, Ph. J. ; Hehenberger, Philipp Paul ; Grasser, Tibor ; Mitard, J. ; Eneman, G. ; Witters, L. ; Hoffmann, T. Y. ; Groeseneken, G. On the impact of the Si passivation layer thickness on the NBTI of nanoscaled Si0.45Ge0.55 pMOSFETsArtikel Article 2011
2Grasser, Tibor ; Kaczer, Ben ; Gös, Wolfgang ; Reisinger, H. ; Aichinger, T. ; Hehenberger, Philipp Paul ; Wagner, Paul-Jürgen ; Schanovsky, Franz ; Franco, J. ; Toledano-Luque, M. ; Nelhiebel, M. The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide TrapsArtikel Article 2011
3Hehenberger, Ph. ; Goes, W. ; Baumgartner, O. ; Franco, J. ; Kaczer, B. ; Grasser, T. Quantum-mechanical modeling of NBTI in high-k SiGe MOSFETsKonferenzbeitrag Inproceedings2011
4Hehenberger Philipp Paul - 2011 - Advanced characterization of the bias...pdf.jpgHehenberger, Philipp Paul Advanced characterization of the bias temperature instabilityThesis Hochschulschrift 2011
5Grasser, T. ; Kaczer, B. ; Goes, W. ; Reisinger, H. ; Aichinger, Th. ; Hehenberger, Ph. ; Wagner, P.-J. ; Schanovsky, F. ; Franco, J. ; Roussel, Ph. ; Nelhiebel, M. Recent advances in understanding the bias temperature instabilityKonferenzbeitrag Inproceedings2010
6Hehenberger, Ph. ; Reisinger, H. ; Grasser, T. Recovery of negative and positive bias temperature stress in pMOSFETsKonferenzbeitrag Inproceedings2010
7Gös, Wolfgang ; Schanovsky, Franz ; Hehenberger, Philipp Paul ; Wagner, Paul-Jürgen ; Grasser, Tibor Charge Trapping and the Negative Bias Temperature InstabilityKonferenzbeitrag Inproceedings2010
8Goes, Wolfgang ; Schanovsky, Franz ; Hehenberger, Philipp ; Wagner, Paul-Juergen ; Grasser, Tibor (Invited) Charge Trapping and the Negative Bias Temperature InstabilityBuchbeitrag Book Contribution2010
9Ceric, Hajdin ; Hehenberger, Philipp Paul ; Milovanovic, Goran ; Sverdlov, Viktor ; Vasicek, Martin ; Selberherr, Siegfried VISTA Status Report June 2009Bericht Report2009
10Hehenberger, Philipp Paul ; Aichinger, T. ; Grasser, Tibor ; Gös, Wolfgang ; Triebl, Oliver ; Kaczer, Ben ; Nelhiebel, M. Do NBTI-Induced Interface States Show Fast Recovery? A Study Using a Corrected On-The-Fly Charge-Pumping Measurement TechniqueKonferenzbeitrag Inproceedings2009
11Grasser, Tibor ; Kaczer, Ben ; Gös, Wolfgang ; Aichinger, T. ; Hehenberger, Philipp Paul ; Nelhiebel, M. A Two-Stage Model for Negative Bias Temperature InstabilityKonferenzbeitrag Inproceedings2009
12Grasser, T. ; Reisinger, H. ; Goes, W. ; Aichinger, Th. ; Hehenberger, Ph. ; Wagner, P.-J. ; Nelhiebel, M. ; Franco, J. ; Kaczer, B. Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noiseKonferenzbeitrag Inproceedings2009
13Hehenberger, Philipp Paul ; Wagner, Paul-Jürgen ; Reisinger, H. ; Grasser, Tibor On the Temperature and Voltage Dependence of Short-Term Negative Bias Temperature StressKonferenzbeitrag Inproceedings2009
14Hehenberger, Philipp Paul ; Wagner, Paul-Jürgen ; Reisinger, H. ; Grasser, Tibor Comparison of Fast Measurement Methods for Short-Term Negative Bias Temperature Stress and RelaxationKonferenzbeitrag Inproceedings2009
15Grasser, Tibor ; Kaczer, Ben ; Gös, Wolfgang ; Aichinger, T. ; Hehenberger, Philipp Paul ; Nelhiebel, M. Understanding Negative Bias Temperature Instability in the Context of Hole TrappingArtikel Article2009
16Hehenberger, Ph. ; Wagner, P.-J. ; Reisinger, H. ; Grasser, T. On the Temperature and Voltage Dependence of Short-Term Negative Bias Temperature StressArtikel Article2009
17Grasser, Tibor ; Wagner, Paul-JÜrgen ; Hehenberger, Philipp ; Goes, Wolfgang ; Kaczer, Ben A Rigorous Study of Measurement Techniques for Negative Bias Temperature InstabilityArtikel Article2008
18Goes, Wolfgang ; Karner, Markus ; Tyaginov, Stansilav ; Hehenberger, Philipp ; Grasser, Tibor Level shifts and gate interfaces as vital ingredients in modeling of charge trappingKonferenzbeitrag Inproceedings2008
19Grasser, Tibor ; Wagner, Paul-Jürgen ; Hehenberger, Philipp Paul ; Gös, Wolfgang ; Kaczer, Ben A Rigorous Study of Measurement Techniques for Negative Bias Temperature InstabilityKonferenzbeitrag Inproceedings2007
20Grasser, Tibor ; Gös, Wolfgang ; Triebl, Oliver ; Hehenberger, Philipp Paul ; Wagner, Paul-Jürgen ; Schwaha, Philipp ; Heinzl, Rene ; Holzer, Stefan ; Entner, Robert ; Wagner, Stephan ; Schanovsky, Franz 3 Year Report 2005-2007Bericht Report2007