Name Card

Full name Familienname, Vorname
Puchner, Stefan
 

Own Publications Eigene Publikationen

Results 1-9 of 9 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Pfister, Martin ; Schützenberger, Kornelia ; Pfeiffenberger, Ulrike ; Messner, Alina ; Chen, Zhe ; Santos, Valentin Aranha dos ; Puchner, Stefan ; Garhöfer, Gerhard ; Schmetterer, Leopold ; Gröschl, Martin ; Werkmeister, René M. Automated segmentation of dermal fillers in OCT images of mice using convolutional neural networksArtikel Article 2019
2Puchner Stefan - 2011 - Characterization of contaminations on semiconductor...pdf.jpgPuchner, Stefan Characterization of contaminations on semiconductor surfaces and thin layer systems with Time of Flight - secondary ion mass spectrometryThesis Hochschulschrift 2011
3Henkel, Christoph ; Bethge, Ole ; Abermann, Stephan ; Puchner, Stefan ; Hutter, Herbert ; Bertagnolli, Emmerich Pt-assisted oxidation of "100...-Ge/high-k interfaces and improvement of their electrical qualityArtikel Article2010
4Zellhofer, Katharina ; Hell, Johannes ; Schäfer, D. ; Eisenmenger-Sittner, Christoph ; Neubauer, E. ; Puchner, Stefan ; Hutter, Herbert PULL-OFF TEST-, SEM-, AFM-, SIMS- AND HEAT-STAGE ESEM INVESTIGATION OF SPUTTER DEPOSITED BORON- AND METAL DOPED BORON INTERLAYER IN THE Cu-C SYSTEMPräsentation Presentation2010
5Henkel, Christoph ; Abermann, Stephan ; Bethge, Ole ; Pozzovivo, Gianmauro ; Puchner, Stefan ; Hutter, Herbert ; Bertagnolli, Emmerich Reduction of the PtGe/Ge Electron Schottky-Barrier Height by Rapid Thermal Diffusion of Phosphorous DopantsArtikel Article 2009
6Puchner, Stefan ; Hutter, Herbert ; Eisenmenger-Sittner, Christoph TOF-SIMS Investigations on thermal treated CuMo-Surfaces on a C-SubstratePräsentation Presentation2007
7Puchner, Stefan ; Hutter, Herbert ; Schnöller, Johannes TOF-SIMS Investigations on Oxide and Nitride LayersPräsentation Presentation2007
8Kiniger, Marianne ; Eisenmenger-Sittner, Christoph ; Hell, J. ; Schwarz, Bernhard ; Hutter, Herbert ; Puchner, Stefan Carbide Formation upon Heat Treatment of Molybdenum Layers Deposited on Carbon Substrates: Comparison of Experimental Data with a Cellular Automaton ModelPräsentation Presentation2007
9Hutter, Herbert ; Schnöller, Johannes ; Schintlmeister, A ; Puchner, Stefan TOF - SIMS Analysis of Thin LayersPräsentation Presentation2007