Full name Familienname, Vorname
Pepponi, Giancarlo
 

Results 1-20 of 221 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Ingerle, D. ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Streli, Christina Combined GIXRF and XRR analysis (GIXA) of nanomaterials in the laboratoryPräsentation Presentation2019
2Ingerle, D. ; Wobrauschek, Peter ; Streli, Christina ; Pepponi, Giancarlo Combined GIXRF and XRR Analysis (GIXA) for the Nondestructive Characterization of Nanomaterials in the LaboratoryPräsentation Presentation2019
3Streli, Christina ; Ingerle, D. ; Iro, M. ; Pepponi, Giancarlo ; Wobrauschek, Peter Characterization of nanomaterials using GIXRF with XRR using lab sourcesPräsentation Presentation2019
4Perneczky, L. ; Rauwolf, M. ; Ingerle, D. ; Eichert, D. ; Brigidi, F. ; Jark, W. ; Bjeoumikhova, S. ; Pepponi, G. ; Wobrauschek, P. ; Streli, C. ; Turyanskaya, A. Temporary implementation and testing of a confocal SR-μXRF system forbone analysis at the X-ray Fluorescence beamline at ElettraArtikel Article 9-May-2018
5Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Artner, W. ; Hradil, K. ; Wobrauschek, Peter ; Streli, Christina Characterization of nanomaterials with GIXRF and XRR using lab sourcesPräsentation Presentation2017
6Turyanskaya, A. ; Perneczky, L. ; Rauwolf, Mirjam ; Wobrauschek, Peter ; Streli, Christina ; Eichert, D.M. ; Brigidi, Fabio ; Jark, W. ; Bjeoumikhova, S. ; Pepponi, Giancarlo ; Roschger, P. Implementation of a Confocal SR-microXRF System for Bone Analysis at the X-ray Fluorescence Beam Line at ElettraPräsentation Presentation2017
7Streli, Christina ; Wobrauschek, Peter ; Ingerle, D. ; Rauwolf, Mirjam ; Turyanskaya, A. ; Prost, Josef ; Perneczky, L. ; Pepponi, Giancarlo GIXRF, SR-TXRF-XANES and μ-XRFPräsentation Presentation2017
8Prost, Josef ; Zinkl, A. ; Ingerle, D. ; Sterba, Johannes H. ; Wobrauschek, Peter ; Streli, Christina ; Eichert, D.M. ; Jark, W. ; Pepponi, Giancarlo ; Migliori, A. ; Karydas, A.G. ; Czyzycki, M. ; Buzanich, G. ; Reinholz, Uwe ; Riesemeier, Heinrich ; Radtke, Martin Trace Element Analysis of Airborne Particulate Matter with TXRF and SR-TXRF-XANESPräsentation Presentation2017
9Prost, Josef ; Zinkl, A. ; Ingerle, D. ; Wobrauschek, Peter ; Streli, Christina ; Eichert, D.M. ; Jark, W. ; Pepponi, Giancarlo ; Migliori, A. ; Karydas, A.G. ; Czyzycki, M. ; Buzanich, G. ; Reinholz, Uwe ; Riesemeier, Heinrich ; Radtke, Martin Applica on of SR-TXRF-XANES for the Analysis of Indoor Aerosol Samples at BESSYII and ELETTRAPräsentation Presentation2017
10Ingerle, D. ; Pepponi, G. ; Meirer, F. ; Wobrauschek, P. ; Streli, C. JGIXA - A software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implantsArtikel Article 2016
11Mihucz, Victor G. ; Meirer, Florian ; Polgári, Zsófia ; Réti, Andrea ; Pepponi, Giancarlo ; Ingerle, Dieter ; Szoboszlai, Norbert ; Streli, Christina Iron overload of human colon adenocarcinoma cells studied by synchrotron‑based X‑ray techniquesArtikel Article 2016
12Streli, Christina ; Ingerle, D. ; Pepponi, Giancarlo ; Wobrauschek, Peter ; Prost, Josef SR-GIXRF and SR-TXRF-XANESPräsentation Presentation2016
13Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Wobrauschek, Peter ; Streli, Christina JGIXA - a software package for the calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implantsPräsentation Presentation2016
14Sávoly, Zoltán ; Buzanich, Günter ; Pepponi, Giancarlo ; Streli, Christina ; Hrács, Krisztina ; Nagy, Péter I. ; Záray, Gyula The fate of nano-ZnO and its bulk counterpart in the body of microscopic nematodes: An X-ray spectrometric studyArtikel Article 2015
15Caby, Bérenger ; Brigidi, Fabio ; Ingerle, D. ; Nolot, E. ; Pepponi, Giancarlo ; Streli, Christina ; Lutterotti, L. ; André, A. ; Rodriguez, G. ; Gergaud, P. ; Morales, M. ; Chateigner, D. Study of annealing-induced interdiffusion in In2O3/Ag/In2O3 structures by a combined X-ray reflectivity and grazing incidence X-ray fluorescence analysisArtikel Article 2015
16Majer, Z. ; Bösze, Szilvia ; Szabó, I. ; Mihucz, V.G. ; Gaál, A. ; Szilvágyi, G. ; Pepponi, Giancarlo ; Meirer, F. ; Wobrauschek, Peter ; Szoboszlai, N. ; Ingerle, D. ; Streli, Christina Study of dinuclear Rh(II) complexes of phenylalanine derivatives as potential anticancer agents by using X-ray fluorescence and X-ray absorptionArtikel Article 2015
17Ingerle, D. ; Wobrauschek, Peter ; Streli, Christina ; Pepponi, Giancarlo ; Leani, J.J. ; Migliori, A. ; Karydas, A.G. ; Eichert, D.M. ; Jark, W. ; Zecevic, J. ; Meirer, F. Comparison of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data Obtained at the XRF Beamline of the Elettra Sincrotrone Trieste and an Optimized Lab SpectrometerPräsentation Presentation2015
18Ingerle, D. ; Wobrauschek, Peter ; Streli, Christina ; Pepponi, Giancarlo ; Meirer, F. JGIXA - A Software Package for the Calculation and Fitting of Grazing Incidence X-ray Fluorescence and X-ray Reflectivity Data for the Characterization of Nanometer-layers and Ultra-shallow-implantsPräsentation Presentation2015
19Caby, B. ; Detlefs, B. ; Picot, G. ; Nolot, E. ; Brigidi, Fabio ; Pepponi, Giancarlo ; Ingerle, D. ; Streli, Christina ; Lutterotti, L. ; Chateigner, D. ; Morales, M. Comparison of Four Data Analysis Software for Combined X-ray Reflectivity and Grazing Incidence X-ray Fluorescence MeasurementsPräsentation Presentation2015
20Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Wobrauschek, Peter ; Streli, Christina Measurement, calculation and fitting of grazing incidence X-ray fluorescence and X-ray reflectivity data for the characterization of nanometer-layers and ultra-shallow-implantsPräsentation Presentation2015