Fleckl, Gernot

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Fleckl, Gernot
 
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Subject:  MOS

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PreviewAuthor(s)TitleTypeIssue Date
1Triendl Fabian - 2018 - Interface trap and mobile charge density in dry oxidized...pdf.jpgTriendl, Fabian Interface trap and mobile charge density in dry oxidized 4H-SiC MOS structures in a wide temperature rangeThesis Hochschulschrift 2018