Grasser, Tibor

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Grasser, Tibor
 
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Contributing Publications Mitbeteiligte Publikationen

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Subject:  Modellierung

Results 1-5 of 5 (Search time: 0.008 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schleich Christian - 2022 - Modeling of defect related reliability phenomena in...pdf.jpgSchleich, Christian Modeling of defect related reliability phenomena in SiC power-MOSFETsThesis Hochschulschrift 2022
2Waschneck Katja Anna - 2020 - Modeling Bias temperature instability in Si and...pdf.jpgWaschneck, Katja Anna Modeling Bias temperature instability in Si and SiC MOSFETs using activation energy mapsThesis Hochschulschrift 2020
3Selinger, Andreas Solution of the Poisson equation on supercomputersThesis Hochschulschrift2018
4Grill Alexander - 2018 - Charge trapping and single-defect extraction in...pdf.jpgGrill, Alexander Charge trapping and single-defect extraction in Gallium-Nitride based MIS-HEMTsThesis Hochschulschrift 2018
5Knobloch Theresia - 2016 - Characterization and physical modeling of degradation...pdf.jpgKnobloch, Theresia Characterization and physical modeling of degradation in MoS2 transistorsThesis Hochschulschrift 2016