Full name Familienname, Vorname
Grasser, Tibor
 
Main Affiliation Organisations­zuordnung
 

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Subject:  Defects

Results 1-4 of 4 (Search time: 0.01 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schleich Christian - 2022 - Modeling of defect related reliability phenomena in...pdf.jpgSchleich, Christian Modeling of defect related reliability phenomena in SiC power-MOSFETsThesis Hochschulschrift 2022
2Weger Magdalena - 2021 - Electric characterization of SiC Trench MOSFETs with...pdf.jpgWeger, Magdalena Electric characterization of SiC Trench MOSFETs with DLTS and admittance spectroscopyThesis Hochschulschrift 2021
3Illarionov Yury - 2016 - Characterization and modeling of charged defects in...pdf.jpgIllarionov, Yury Characterization and modeling of charged defects in silicon and 2D field-effect transistorsThesis Hochschulschrift 2016
4Stradiotto Roberta - 2016 - Characterization of electrically active defects at...pdf.jpgStradiotto, Roberta Characterization of electrically active defects at III-N/dielectric interfacesThesis Hochschulschrift 2016